Invention Grant
- Patent Title: Block level grading for reliability and yield improvement
- Patent Title (中): 块级分级可靠性和产量提高
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Application No.: US13527199Application Date: 2012-06-19
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Publication No.: US08953398B2Publication Date: 2015-02-10
- Inventor: Dana Lee , Jianmin Huang , Mrinal Kochar , Ashish Ghai
- Applicant: Dana Lee , Jianmin Huang , Mrinal Kochar , Ashish Ghai
- Applicant Address: US TX Plano
- Assignee: SanDisk Technologies Inc.
- Current Assignee: SanDisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Brinks Gilson & Lione
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
A system for grading blocks may be used to improve memory usage. Blocks of memory, such as on a flash card, may be graded on a sliding scale that may identify a level of “goodness” or a level of “badness” for each block rather than a binary good or bad identification. This grading system may utilize at least three tiers of grades which may improve efficiency by better utilizing each block based on the individual grades for each block. The block leveling grading system may be used for optimizing the competing needs of minimizing yield loss while minimizing testing defect escapes.
Public/Granted literature
- US20130336059A1 BLOCK LEVEL GRADING FOR RELIABILITY AND YIELD IMPROVEMENT Public/Granted day:2013-12-19
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