Invention Grant
- Patent Title: Measuring device and measuring method for continuous physical quantity
- Patent Title (中): 连续物理量测量装置及测量方法
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Application No.: US13382918Application Date: 2010-07-06
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Publication No.: US08954294B2Publication Date: 2015-02-10
- Inventor: Yushan Hao
- Applicant: Yushan Hao
- Applicant Address: CN Baoding, Hebei
- Assignee: Baoding Sanchuan Electric Co., Ltd.
- Current Assignee: Baoding Sanchuan Electric Co., Ltd.
- Current Assignee Address: CN Baoding, Hebei
- Agency: Houteman Law LLC
- Priority: CN200910158375 20090708
- International Application: PCT/CN2010/075008 WO 20100706
- International Announcement: WO2011/003347 WO 20110113
- Main IPC: H04B15/00
- IPC: H04B15/00 ; G01D1/00 ; G06F11/30 ; G01R19/25

Abstract:
The invention discloses a measuring device and a measuring method for a continuous physical quantity. The measuring device comprises a timing unit for outputting a time base and a time scale; a sampling unit for sampling the continuous physical quantity under control of the time base and at time intervals that meet the Nyquist sampling theorem, and outputting a sampling value; a decision unit for deciding whether the sampling value turns into a transient state from a steady state or turns into the steady state from the transient state; a calculating unit for calculating a steady state value for the sampling value of the sampling unit in the steady state; and an output unit for outputting the start time of the steady state and the steady state value X, and the start time and the sampling value of the transient state according to the result of decision and the time scale. The invention may not only avoid the aliasing and but also reduce the output data volume.
Public/Granted literature
- US20120109586A1 MEASURING DEVICE AND MEASURING METHOD FOR CONTINUOUS PHYSICAL QUANTITY Public/Granted day:2012-05-03
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