Invention Grant
- Patent Title: Fault-based software testing method and system
- Patent Title (中): 基于故障的软件测试方法和系统
-
Application No.: US13645555Application Date: 2012-10-05
-
Publication No.: US08954807B2Publication Date: 2015-02-10
- Inventor: Yu Seung Ma , Duk Kyun Woo , Seon Tae Kim , Pyeong Soo Mah
- Applicant: Electronics & Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics & Telecommunications Research Institute
- Current Assignee: Electronics & Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2012-0073379 20120705
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
A fault-based software testing method and system are provided. The fault-based software testing method includes: generating a plurality of error programs by injecting faults into a testing target program; grouping the generated error programs into a plurality of groups with respect to respective test data, and selecting representative error programs with respect to the respective groups; and when an error is detected in the execution result of the representative error programs with respect to the corresponding test data, determining that errors are detected in all the error programs of the corresponding group.
Public/Granted literature
- US20140013164A1 FAULT-BASED SOFTWARE TESTING METHOD AND SYSTEM Public/Granted day:2014-01-09
Information query