Invention Grant
- Patent Title: System test scope and plan optimization
- Patent Title (中): 系统测试范围和计划优化
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Application No.: US13566149Application Date: 2012-08-03
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Publication No.: US08954931B2Publication Date: 2015-02-10
- Inventor: Marcus Wefers , Reinhold Konnerth , Thierry Lieu , Abdelhak Nezzari , Michael Schaffrath , Torsten Kamenz , Andreas Kemmler
- Applicant: Marcus Wefers , Reinhold Konnerth , Thierry Lieu , Abdelhak Nezzari , Michael Schaffrath , Torsten Kamenz , Andreas Kemmler
- Applicant Address: DE Walldorf
- Assignee: SAP SE
- Current Assignee: SAP SE
- Current Assignee Address: DE Walldorf
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G06F9/45
- IPC: G06F9/45 ; G06F11/36

Abstract:
Various embodiments include at least one or systems, methods, and software providing abilities to automatically generate a test plan that mitigates risk involved in testing less than an entirety of a software system following modification. Some embodiments operate to allow a user to influence the scope of an optimized test plan while also reducing a number of tests and test execution effort involved. Such embodiments may identify portions of the software system to test and portions of the software system that will not be tested in a manner that reduces a total testing effort involved. Reductions in testing effort are performed in generation of the test plan in view of testing preferences which are utilized not only to reduce the total effort in executing a test plan, but also does so to optimize the test plan.
Public/Granted literature
- US20140040867A1 SYSTEM TEST SCOPE AND PLAN OPTIMIZATION Public/Granted day:2014-02-06
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