Invention Grant
US08958066B2 Optical analysis method using measurement of light of two or more wavelength bands
有权
使用两个或更多个波长带的光的测量的光学分析方法
- Patent Title: Optical analysis method using measurement of light of two or more wavelength bands
- Patent Title (中): 使用两个或更多个波长带的光的测量的光学分析方法
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Application No.: US13789111Application Date: 2013-03-07
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Publication No.: US08958066B2Publication Date: 2015-02-17
- Inventor: Takuya Hanashi , Tetsuya Tanabe , Mitsushiro Yamaguchi , Hidetaka Nakata
- Applicant: Olympus Corporation
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2010-202994 20100910
- Main IPC: G01N21/00
- IPC: G01N21/00 ; G01N21/64

Abstract:
There is provided an optical analysis technique enabling identification of a kind of light-emitting particle corresponding to a signal on a time series light intensity data or identification of a signal corresponding to light-emitting particles other than a particle to be observed in an optical measurement using a confocal microscope or a multiphoton microscope. The inventive optical analysis technique measures simultaneously and separately intensities of lights of two or more wavelength bands from a light detection region in a sample solution containing light-emitting particles of two or more kinds to generate time series light intensity data of the respective wavelength bands; detects signals simultaneously generated on the time series light intensity data of at least two wavelength bands; and identifies the simultaneously generated signals as signals of a light-emitting particle of at least one specific kind.
Public/Granted literature
- US20130230874A1 OPTICAL ANALYSIS METHOD USING MEASUREMENT OF LIGHT OF TWO OR MORE WAVELENGTH BANDS Public/Granted day:2013-09-05
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