Invention Grant
- Patent Title: Method for doping semiconductor structures and the semiconductor device thereof
- Patent Title (中): 掺杂半导体结构的方法及其半导体器件
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Application No.: US13938750Application Date: 2013-07-10
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Publication No.: US08962369B2Publication Date: 2015-02-24
- Inventor: Roger Loo , Frederik Leys , Matty Caymax
- Applicant: IMEC
- Applicant Address: BE Leuven
- Assignee: IMEC
- Current Assignee: IMEC
- Current Assignee Address: BE Leuven
- Agency: McDonnell Boehnen Hulbert & Berghoff LLP
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L29/66 ; H01L21/225 ; H01L29/10 ; H01L29/78

Abstract:
A method for introducing species into a strained semiconductor layer comprising: providing a substrate comprising a first region comprising an exposed strained semiconductor layer, loading the substrate in a reaction chamber, then forming a conformal first species containing-layer by vapor phase deposition (VPD) at least on the exposed strained semiconductor layer, and thereafter performing a thermal treatment, thereby diffusing at least part of the first species from the first species-containing layer into the strained semiconductor layer and activating at least part of the diffused first species in the strained semiconductor layer.
Public/Granted literature
- US20140008727A1 Method for Doping Semiconductor Structures and the Semiconductor Device Thereof Public/Granted day:2014-01-09
Information query
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