Invention Grant
- Patent Title: Pattern detection based on fractal analysis
- Patent Title (中): 基于分形分析的模式检测
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Application No.: US11559683Application Date: 2006-11-14
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Publication No.: US08965136B2Publication Date: 2015-02-24
- Inventor: Charles Jaffe , Alfred H. Stiller
- Applicant: Charles Jaffe , Alfred H. Stiller
- Applicant Address: US WV Morgantown
- Assignee: West Virginia University
- Current Assignee: West Virginia University
- Current Assignee Address: US WV Morgantown
- Agency: Thomas | Horstemeyer, LLP.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/52

Abstract:
Various systems, methods, and programs embodied in computer-readable mediums are provided for the detection of patterns. In one embodiment, a pattern detection method is provided that comprises the step of performing a fractal analysis of a pattern to generate a plurality of scaling parameters from a fractal associated with the pattern in a computer system. In addition, the method further comprises the step of detecting a degree of organization in the pattern by examining a degree of equality among the scaling parameters of the fractal in the computer system.
Public/Granted literature
- US20080112624A1 Pattern Detection Based on Fractal Analysis Public/Granted day:2008-05-15
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