Invention Grant
- Patent Title: Obtaining debug information from a flash memory device
- Patent Title (中): 从闪存设备获取调试信息
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Application No.: US13032541Application Date: 2011-02-22
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Publication No.: US08966319B2Publication Date: 2015-02-24
- Inventor: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- Applicant: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Stephen J. Curran
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/36

Abstract:
This document generally describes systems, devices, methods, and techniques for obtaining debug information from a memory device. Debug information can include a variety of information associated with a memory device that can be used for debugging the device, such as a sequence of operations performed by the memory device and information regarding errors that have occurred (e.g., type of error, component of memory device associated with error). A memory device can be instructed by a host to obtain and provide debug information to the host. A memory device can be configured to obtain particular debug information using a variety of features, such as triggers. For instance, a memory device can use a trigger to collect debug information related to failed erase operations.
Public/Granted literature
- US20120216079A1 Obtaining Debug Information from a Flash Memory Device Public/Granted day:2012-08-23
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