Invention Grant
US08966979B2 Method and device for measuring the thickness of any deposit of material on an inner wall of a structure 有权
用于测量结构内壁上任何材料沉积物的厚度的方法和装置

Method and device for measuring the thickness of any deposit of material on an inner wall of a structure
Abstract:
A method of measuring the thickness of any deposit of material (28) on an inner wall (12) of a structure (14). The method comprises: (a) causing vibrations in the structure; (b) detecting said vibrations in the structure; (c) determining a resonance frequency of the structure based on the detected vibrations; and (d) determining the thickness of any deposit of material on the inner wall of the structure based on the determined resonance frequency.
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