Invention Grant
- Patent Title: External force detecting device and external force detecting sensor
- Patent Title (中): 外力检测装置和外力检测传感器
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Application No.: US13374769Application Date: 2012-01-11
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Publication No.: US08966980B2Publication Date: 2015-03-03
- Inventor: Mitsuaki Koyama , Takeru Mutoh , Hiroki Iwai , Yoshiaki Amano , Ryoichi Ichikawa
- Applicant: Mitsuaki Koyama , Takeru Mutoh , Hiroki Iwai , Yoshiaki Amano , Ryoichi Ichikawa
- Applicant Address: JP Tokyo
- Assignee: Nihon Dempa Kogyo Co., Ltd.
- Current Assignee: Nihon Dempa Kogyo Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Jordan and Hamburg LLP
- Priority: JP2011-006894 20110117; JP2011-079938 20110331; JP2011-144903 20110629
- Main IPC: G01H13/00
- IPC: G01H13/00 ; G01P15/097 ; G01P1/02 ; G01P15/125 ; G01L1/14 ; G01L1/16 ; G01P15/08

Abstract:
A device is provided for a detecting external force applied to piezoelectric piece. A crystal piece is cantilever-supported in a container. Excitation electrodes are formed on an upper face and lower face, respectively. A movable electrode, connected via a lead-out electrode to the excitation electrode, is formed on the lower face side at a front end of the crystal piece. A fixed electrode is provided on a bottom portion of the container to face this movable electrode. The excitation electrode on the upper face side and the fixed electrode are connected to an oscillation circuit. When the crystal piece bends in response to an applied external force, capacitance between the movable electrode and fixed electrode, changes. This capacitance change results in a corresponding change in oscillation frequency of the crystal piece.
Public/Granted literature
- US20120180568A1 External force detecting device and external force detecting sensor Public/Granted day:2012-07-19
Information query
IPC分类:
G | 物理 |
G01 | 测量;测试 |
G01H | 机械振动或超声波、声波或次声波的测量 |
G01H13/00 | 测量谐振(共振)频率 |