Invention Grant
US08967001B2 Testing device and testing system for testing reliability of interface employed by electronic device
有权
用于测试电子设备使用接口可靠性的测试设备和测试系统
- Patent Title: Testing device and testing system for testing reliability of interface employed by electronic device
- Patent Title (中): 用于测试电子设备使用接口可靠性的测试设备和测试系统
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Application No.: US13778892Application Date: 2013-02-27
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Publication No.: US08967001B2Publication Date: 2015-03-03
- Inventor: Jun-Liang Zhang
- Applicant: Fu Tai Hua Industry (Shenzhen) Co., Ltd. , Hon Hai Precision Industry Co., Ltd.
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Fu Tai Hua Industry (Shenzhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201210046950 20120228
- Main IPC: G01N3/00
- IPC: G01N3/00 ; G01N19/00 ; G01N3/32 ; G01R31/04 ; G01N3/38 ; G01M99/00

Abstract:
An exemplary testing device includes a shell, a motor, a wheel rotating eccentrically, a testing plug, and a sliding assembly. The sliding assembly is configured to move back and forth along a first direction in a first accommodating space of the shell. A periphery of the wheel abuts against two opposite sides of the sliding assembly. An eccentricity e defined between a eccentric hole of the wheel and the center of the wheel causes the sliding assembly to move back and forth along the first direction when the wheel rotates eccentrically. The testing plug connects to the sliding assembly and moves back and forth in unison with the sliding assembly, such that the testing plug can be inserted into the interface of the electronic device more than once.
Public/Granted literature
- US20130220023A1 TESTING DEVICE AND TESTING SYSTEM FOR TESTING RELIABILITY OF INTERFACE EMPLOYED BY ELECTRONIC DEVICE Public/Granted day:2013-08-29
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