Invention Grant
- Patent Title: Composition for resist underlayer film and process for producing same
- Patent Title (中): 抗蚀剂下层膜的组合物及其制造方法
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Application No.: US12715406Application Date: 2010-03-02
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Publication No.: US08968458B2Publication Date: 2015-03-03
- Inventor: Keiji Konno , Masato Tanaka , Momoko Ishii , Junichi Takahashi , Tomoki Nagai
- Applicant: Keiji Konno , Masato Tanaka , Momoko Ishii , Junichi Takahashi , Tomoki Nagai
- Applicant Address: JP Tokyo
- Assignee: JSR Corporation
- Current Assignee: JSR Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-055812 20050301; JP2005-330194 20051115
- Main IPC: C07F7/08
- IPC: C07F7/08 ; G03F7/075 ; G03F7/11 ; H01L21/027 ; H01L21/033

Abstract:
A composition for a resist underlayer film is provided. The composition has excellent storage stability and can form a resist underlayer film which has excellent adhesion to a resist film, can improve reproducibility of a resist pattern and is resistant to an alkaline liquid used in development and to oxygen asking during the removal of a resist. The composition comprises a hydrolyzate and/or a condensate of a silane compound of the following formula (A), R1bR2cSi(OR3)4-a (A) wherein R1 is a monovalent organic group having at least one unsaturated bond, R2 individually represents a hydrogen atom, a halogen atom or a monovalent organic group, R3 individually represents a monovalent organic group, R1 is a group other than OR3, a is an integer of 1 to 3, b is an integer of 1 to 3, and c is an integer of 0 to 2, provided that a=b+c.
Public/Granted literature
- US20100151384A1 COMPOSITION FOR RESIST UNDERLAYER FILM AND PROCESS FOR PRODUCING SAME Public/Granted day:2010-06-17
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