Invention Grant
- Patent Title: Sample analyzer
- Patent Title (中): 样品分析仪
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Application No.: US13672172Application Date: 2012-11-08
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Publication No.: US08968653B2Publication Date: 2015-03-03
- Inventor: Daigo Fukuma , Takaaki Nagai , Masaharu Shibata
- Applicant: Sysmex Corporation
- Applicant Address: JP Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Hyogo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-276637 20081028
- Main IPC: G01N33/50
- IPC: G01N33/50 ; G01N33/48 ; G01N33/49 ; G01N15/14 ; G01N21/17 ; G01N27/00 ; G01N15/10 ; G01N15/12 ; G01N15/00

Abstract:
A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.
Public/Granted literature
- US20130065317A1 SAMPLE ANALYZER Public/Granted day:2013-03-14
Information query
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