Invention Grant
- Patent Title: Photomask blank, process for production of photomask, and chromium-containing material film
- Patent Title (中): 光掩模坯料,光掩模生产工艺和含铬材料膜
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Application No.: US13883850Application Date: 2011-11-18
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Publication No.: US08968972B2Publication Date: 2015-03-03
- Inventor: Hiroki Yoshikawa , Souichi Fukaya , Yukio Inazuki , Tsuneo Yamamoto , Hideo Nakagawa
- Applicant: Hiroki Yoshikawa , Souichi Fukaya , Yukio Inazuki , Tsuneo Yamamoto , Hideo Nakagawa
- Applicant Address: JP Tokyo
- Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee: Shin-Etsu Chemical Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2010-259675 20101122; JP2011-127511 20110607
- International Application: PCT/JP2011/006422 WO 20111118
- International Announcement: WO2012/070209 WO 20120531
- Main IPC: G03F1/50
- IPC: G03F1/50 ; C22C27/06 ; G03F1/54 ; G03F1/80 ; C23C14/06 ; G03F1/30

Abstract:
In the chromium-containing material film of the present invention, an element is added thereto and is capable of bringing a mixture of the element and the chromium into a liquid phase at a temperature of 400° C. or lower. The use of such a chromium-containing material film as an optical film (e.g., a light-shielding film, an etching mask film, or an etching stopper film) of a photo mask blank can achieve an improvement in chlorine-dry etching while retaining the same optical characteristics and the like as those of the conventional chromium-containing material film, thereby increasing the patterning precision.
Public/Granted literature
- US08709686B2 Photomask blank, process for production of photomask, and chromium-containing material film Public/Granted day:2014-04-29
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