Invention Grant
- Patent Title: Microanalysis methods and systems using field effect transistor
- Patent Title (中): 微分析方法和系统采用场效应晶体管
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Application No.: US13233684Application Date: 2011-09-15
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Publication No.: US08969099B2Publication Date: 2015-03-03
- Inventor: Chil Seong Ah , Jong-Heon Yang , Chan Woo Park , Chang-Geun Ahn , Gun Yong Sung
- Applicant: Chil Seong Ah , Jong-Heon Yang , Chan Woo Park , Chang-Geun Ahn , Gun Yong Sung
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Priority: KR10-2010-0091207 20100916; KR10-2011-0008837 20110128
- Main IPC: G01N27/00
- IPC: G01N27/00 ; G01N27/414 ; G01N27/327 ; G01N33/543 ; G01N33/53 ; G01N33/58 ; G01N33/553 ; G01N21/65

Abstract:
Provided is a microanalysis method and system using a Field Effect Transistor (FET). The microanalysis method includes a channel region having a receptor molecule fixed; forming a nano-particle conjugate in the channel region by supplying a sample for test and the nano-particle conjugate to the FET; growing a probe material on the channel region; and measuring a current flowing through the channel region, wherein the receptor molecule is a material that is selectively bonded to a target molecule in the sample for test.
Public/Granted literature
- US20120070910A1 MICROANALYSIS METHODS AND SYSTEMS USING FIELD EFFECT TRANSISTOR Public/Granted day:2012-03-22
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