Invention Grant
US08969122B2 Processes for uniform metal semiconductor alloy formation for front side contact metallization and photovoltaic device formed therefrom
有权
用于前侧接触金属化的均匀金属半导体合金形成工艺和由其形成的光电器件
- Patent Title: Processes for uniform metal semiconductor alloy formation for front side contact metallization and photovoltaic device formed therefrom
- Patent Title (中): 用于前侧接触金属化的均匀金属半导体合金形成工艺和由其形成的光电器件
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Application No.: US13159897Application Date: 2011-06-14
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Publication No.: US08969122B2Publication Date: 2015-03-03
- Inventor: Kathryn C. Fisher , Qiang Huang , Satyavolu S. Papa Rao , David L. Rath
- Applicant: Kathryn C. Fisher , Qiang Huang , Satyavolu S. Papa Rao , David L. Rath
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent Louis J. Percello, Esq.
- Main IPC: H01L31/18
- IPC: H01L31/18 ; H01L31/0216 ; H01L31/0224

Abstract:
Processes for fabricating photovoltaic devices in which the front side contact metal semiconductor alloy metallization patterns have a uniform thickness at edge portions as well as a central portion of each metallization pattern are provided. In one embodiment, a method of forming a photovoltaic device is provided that includes a p-n junction with a p-type semiconductor portion and an n-type semiconductor portion one on top of the other, wherein an upper exposed surface of one of the semiconductor portions represents a front side surface of the semiconductor substrate; forming a plurality of patterned antireflective coating layers on the front side surface of the semiconductor surface to provide a grid pattern including a busbar region and finger regions; forming a mask atop the plurality of patterned antireflective coating layers, the mask having a shape that mimics each patterned antireflective coating; electrodepositing a metal layer on the busbar region and the finger regions; removing the mask; and performing an anneal, wherein during the anneal metal atoms from the metal layer react with semiconductor atoms from the busbar region and the finger regions forming a metal semiconductor alloy.
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