Invention Grant
- Patent Title: Etching technique for creation of thermally-isolated microstructures
- Patent Title (中): 用于创建热隔离微结构的蚀刻技术
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Application No.: US13091417Application Date: 2011-04-21
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Publication No.: US08969203B2Publication Date: 2015-03-03
- Inventor: Leslie M. Landsberger , Oleg Grudin , Jens Urban , Uwe Schwarz
- Applicant: Leslie M. Landsberger , Oleg Grudin , Jens Urban , Uwe Schwarz
- Applicant Address: DE Puchheim
- Assignee: Sensortechnics GmbH
- Current Assignee: Sensortechnics GmbH
- Current Assignee Address: DE Puchheim
- Agency: Norton Rose Fulbright LLP
- Main IPC: H01L21/302
- IPC: H01L21/302 ; H01L21/764 ; B81C1/00 ; H01L21/306

Abstract:
There is described a method for creating a thermally-isolated microstructure on a slab of mono-crystalline silicon which uses a hybrid dry-then-wet etch technique that when controlled, can produce microstructures without any silicon adhering underneath, microstructures having small masses of silicon adhering underneath, and microstructures that are still attached to the slab of mono-crystalline silicon via a waisted silicon body. When creating the microstructures with a waisted silicon body, the thermal isolation of the microstructure can be designed by controlling the depth of the etching and the size of the waist.
Public/Granted literature
- US20110314435A1 ETCHING TECHNIQUE FOR CREATION OF THERMALLY-ISOLATED MICROSTRUCTURES Public/Granted day:2011-12-22
Information query
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