Invention Grant
- Patent Title: Terahertz wave measurement device and method
- Patent Title (中): 太赫兹波测量装置及方法
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Application No.: US13857249Application Date: 2013-04-05
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Publication No.: US08969805B2Publication Date: 2015-03-03
- Inventor: Takayuki Hasebe , Hitoshi Tabata , Shigeru Kitamura
- Applicant: Takayuki Hasebe , Hitoshi Tabata , Shigeru Kitamura
- Applicant Address: JP Tokyo JP Kyoto
- Assignee: The University of Tokyo,ARKRAY, Inc.
- Current Assignee: The University of Tokyo,ARKRAY, Inc.
- Current Assignee Address: JP Tokyo JP Kyoto
- Agency: Morgan, Lewis & Bockius LLP
- Priority: JP2012-224555 20121009
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01N21/59 ; G01N21/01 ; G01N21/3581 ; G01N21/552

Abstract:
The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves.
Public/Granted literature
- US20140097344A1 Terahertz Wave Measurement Device and Method Public/Granted day:2014-04-10
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