Invention Grant
- Patent Title: Guard ring design for maintaining signal integrity
- Patent Title (中): 保护环设计,保持信号完整性
-
Application No.: US13729389Application Date: 2012-12-28
-
Publication No.: US08970001B2Publication Date: 2015-03-03
- Inventor: Mirng-Ji Lii , Hao-Yi Tsai , Hsien-Wei Chen , Hung-Yi Kuo
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L23/58
- IPC: H01L23/58 ; H01L23/31 ; H01L23/522 ; H01L23/00

Abstract:
A structure includes a metal feature, and a passivation layer having a portion overlapping the metal feature. The passivation layer includes a non-low-k dielectric material. A polymer layer is over the passivation layer. A Post-Passivation Interconnect (PPI) extends into the polymer layer to electrically couple to the metal feature. A guard ring includes a second PPI, wherein the guard ring is electrically grounded. The second PPI substantially encircles the first PPI.
Public/Granted literature
- US20140183690A1 Guard Ring Design for Maintaining Signal Integrity Public/Granted day:2014-07-03
Information query
IPC分类: