Invention Grant
- Patent Title: Test carrier and board assembly
- Patent Title (中): 测试载体和电路板组件
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Application No.: US13448839Application Date: 2012-04-17
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Publication No.: US08970243B2Publication Date: 2015-03-03
- Inventor: Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
- Applicant: Yoshinari Kogure , Takashi Fujisaki , Kiyoto Nakamura
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Greenblum & Bernstein, P.L.C.
- Priority: JP2011-93867 20110420; JP2011-236482 20111027
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/04 ; G01R31/28
Abstract:
A test carrier 10A comprises: a base board 21A which holds a die 90; and a cover board 31A which is laid over the base board 21A so as to cover the die 90. The test carrier 10A comprises a seal member 24 which is interposed between the base board 21A and the cover board 31A and which surrounds the die 90.
Public/Granted literature
- US20120268157A1 TEST CARRIER AND BOARD ASSEMBLY Public/Granted day:2012-10-25
Information query
