A probing device for a TFT-LCD substrate, which includes a device body, a device body, a circuit board mounted on the device body, a plurality of motors mounted on the device body, and a plurality of probe pins respectively mounted to the motors. The motors and the probe pins are arranged in a one-to-one corresponding manner. The circuit board includes a programmable logic controller and a man-machine interface terminal electrically connected to the programmable logic controller. The plurality of motors and the plurality of probe pins are electrically connected to the programmable logic controller. The plurality of probe pins is set at locations corresponding to locations of panel inspection signal input pads of TFT substrates of various sizes. The programmable logic controller uses the motors to control the elevation and lowering of the probe pins.