Invention Grant
- Patent Title: Systems and methods for measuring sheet resistance
- Patent Title (中): 用于测量薄层电阻的系统和方法
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Application No.: US13601762Application Date: 2012-08-31
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Publication No.: US08970464B2Publication Date: 2015-03-03
- Inventor: Kingsuk Brahma , Saman Saeedi , Sang Y. Youn , Shafiq M Jamal , Taif A. Syed
- Applicant: Kingsuk Brahma , Saman Saeedi , Sang Y. Youn , Shafiq M Jamal , Taif A. Syed
- Applicant Address: US CA Cupertino
- Assignee: Appl Inc.
- Current Assignee: Appl Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Fletcher Yoder PC
- Main IPC: G09G3/36
- IPC: G09G3/36 ; G01N27/04 ; G06F17/00 ; H01L21/28 ; G09G3/00

Abstract:
The present disclosure is directed to systems and methods for determining sheet resistance values in a liquid crystal display (LCD) panel. In certain embodiments, a system for determining sheet resistance values in an LCD panel may include a display driver integrated circuit (IC). The display driver IC may include a first switch coupled to a first input/output (I/O) pad and a second I/O pad such that the first I/O pad is configured to couple to a voltage source and the second I/O pad is configured to couple to a current source. The display driver IC may also include a second switch coupled to a third I/O pad and the second I/O pad such that the second switch has substantially the same geometry as the first switch and the third I/O pad is configured to couple to a thin-film transistor (TFT) layer of the display panel.
Public/Granted literature
- US20140062845A1 SYSTEMS AND METHODS FOR MEASURING SHEET RESISTANCE Public/Granted day:2014-03-06
Information query
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