Invention Grant
- Patent Title: Reliability metal traces
- Patent Title (中): 可靠性金属痕迹
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Application No.: US12110117Application Date: 2008-04-25
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Publication No.: US08970504B2Publication Date: 2015-03-03
- Inventor: Lili Huang , John Z. Zhong , Steve Porter Hotelling
- Applicant: Lili Huang , John Z. Zhong , Steve Porter Hotelling
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Morrison & Foerster LLP
- Main IPC: G06F3/041
- IPC: G06F3/041 ; G06F3/044

Abstract:
The formation of improved reliability conductive traces in touch sensor panels that are less prone to failures due to environmental effects is disclosed. Conductive traces, which can be formed from a stackup of metal layers or a single metal layer, can be protected with an additional photoimageable passivation layer of a material such as an organic polymer. This photoimageable coating can be patterned so that it does not appear in the visible area of the touch sensor panel, with much finer tolerances than conventional passivation layers to help keep product dimensions to a minimum.
Public/Granted literature
- US20090266621A1 Reliability Metal Traces Public/Granted day:2009-10-29
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