Invention Grant
- Patent Title: Three-dimensional measurement apparatus, three-dimensional measurement method and storage medium
- Patent Title (中): 三维测量装置,三维测量方法和存储介质
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Application No.: US13325463Application Date: 2011-12-14
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Publication No.: US08970674B2Publication Date: 2015-03-03
- Inventor: Kazuyuki Ota
- Applicant: Kazuyuki Ota
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2010-293804 20101228
- Main IPC: H04N13/02
- IPC: H04N13/02 ; G01B11/16 ; G01B11/25

Abstract:
A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.
Public/Granted literature
- US20120162371A1 THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREMENT METHOD AND STORAGE MEDIUM Public/Granted day:2012-06-28
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