Invention Grant
US08970674B2 Three-dimensional measurement apparatus, three-dimensional measurement method and storage medium 有权
三维测量装置,三维测量方法和存储介质

Three-dimensional measurement apparatus, three-dimensional measurement method and storage medium
Abstract:
A three-dimensional measurement apparatus comprises a light irradiation unit adapted to irradiate a measurement target with pattern light, an image capturing unit adapted to capture an image of the measurement target, and a measurement unit adapted to measure a three-dimensional shape of the measurement target from the captured image, the three-dimensional measurement apparatus further comprising: a change region extraction unit adapted to extract a change region where a change has occurred when comparing an image of the measurement target captured in advance with the captured image of the measurement target; and a light characteristic setting unit adapted to set characteristics of the pattern light from the change region, wherein the measurement unit measures the three-dimensional shape of the measurement target at the change region in a captured image after irradiation of the change region with the pattern light with the characteristics set by the light characteristic setting unit.
Information query
Patent Agency Ranking
0/0