Invention Grant
- Patent Title: Method and microscope for three-dimensional resolution-enhanced microscopy
- Patent Title (中): 三维分辨率增强显微镜的方法和显微镜
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Application No.: US13499203Application Date: 2010-08-26
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Publication No.: US08970688B2Publication Date: 2015-03-03
- Inventor: Thomas Kalkbrenner , Ralf Wolleschensky
- Applicant: Thomas Kalkbrenner , Ralf Wolleschensky
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Duane Morris LLP
- Priority: DE102009043744 20090930
- International Application: PCT/EP2010/005247 WO 20100826
- International Announcement: WO2011/038810 WO 20110407
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G02B21/16 ; G01N21/64 ; G02B21/36 ; G02B27/58

Abstract:
The invention relates to a high resolution microscope for three-dimensionally determining the position of objects, in particular individual fluorophores, and preferably for the high spatial resolution luminescence microscopy of a sample, which is marked with marker molecules that can be activated or switched using a signal such that they can be induced to emit certain luminescent radiation only in the activated state. The object is represented by means of an imaging system, preferably the microscope lens, on a surface detector consisting of individual detector elements. At least one microlens array is located in front of the detector elements, and different, preferably adjacent, detector elements receive light from microlenses having different focal lengths and from different object planes, or wherein by means of at least once microlens array, located in part in front of the detector elements, a different object plane is represented on the detector elements in the direction of the light behind the microlenses than on detector elements having no microlenses in front of the latter.
Public/Granted literature
- US20120224034A1 METHOD AND MICROSCOPE FOR THREE-DIMENSIONAL RESOLUTION-ENHANCED MICROSCOPY Public/Granted day:2012-09-06
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