Invention Grant
- Patent Title: Optical image measuring device
- Patent Title (中): 光学图像测量装置
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Application No.: US13147536Application Date: 2009-12-09
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Publication No.: US08970847B2Publication Date: 2015-03-03
- Inventor: Yusuke Ono
- Applicant: Yusuke Ono
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Topcon
- Current Assignee: Kabushiki Kaisha Topcon
- Current Assignee Address: JP Tokyo
- Agency: Pearne & Gordon LLP
- Priority: JP2009-022622 20090203
- International Application: PCT/JP2009/006711 WO 20091209
- International Announcement: WO2010/089833 WO 20100812
- Main IPC: G01B11/02
- IPC: G01B11/02 ; G01B9/02 ; G01B11/22 ; A61B3/10 ; G01N21/47

Abstract:
An optical image measuring device includes: an optical system that generates and detects interference light; an image forming part that forms a tomographic image based on the detection; an alignment part that performs alignment of the optical system with respect to an object; a focusing part that focuses the optical system with respect to the region of interest; a determining part that determines the suitability of the position of the optical system by the alignment part, the suitability of the focus state by the focusing part, and the suitability of the position of the tomographic image in a frame; a control part that, when it is determined that all of the positions of the optical system, position of focus state and the position in said frame are appropriate, controls the optical system and the image forming part, making it possible to obtain the tomographic image of the region of interest.
Public/Granted literature
- US20110286003A1 OPTICAL IMAGE MEASURING DEVICE Public/Granted day:2011-11-24
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