Invention Grant
- Patent Title: Sample holder for a microscope
- Patent Title (中): 样品架用于显微镜
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Application No.: US13582061Application Date: 2011-02-25
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Publication No.: US08970952B2Publication Date: 2015-03-03
- Inventor: Jonas Fölling , Marcus Dyba
- Applicant: Jonas Fölling , Marcus Dyba
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Hodgson Russ LLP
- Priority: DE102010009679 20100301
- International Application: PCT/EP2011/052797 WO 20110225
- International Announcement: WO2011/107401 WO 20110909
- Main IPC: G02B21/26
- IPC: G02B21/26

Abstract:
A sample retainer for a microscope is described, comprising a sample stage (32), a holder (34) arranged on the sample stage (32), a sample carrier (36), couplable to the holder (34), to which a sample is attachable, and an adjusting apparatus (44), engaging on the holder (34), with which with the sample carrier (36), together with the holder (34) to which the sample carrier (36) is coupled, is displaceable on the sample stage (32), relative to the objective (46), into a target position. A decoupling apparatus that decouples the sample carrier (36), arranged in the target position, from the holder (34) upon imaging of the sample through the objective (46) is provided.
Public/Granted literature
- US20130033744A1 Sample Holder For A Microscope Public/Granted day:2013-02-07
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