A leak current absorption circuit for absorbing a leak current from an output transistor includes a switch connected to a grounding node on one end, a constant voltage circuit connected between the other end of the switch and an output node, a switch-operating circuit connected between the output node and the grounding node to operate the switch based on a voltage of the output node. When the voltage of the output node becomes equal to a predetermined threshold voltage or more, the switch-operating circuit turns on the switch to clamp the voltage of the output node by allowing at least a portion of the leak current from the output transistor flow to the grounding node.