Invention Grant
US08971136B2 Memory device correcting the effect of collision of high-energy particles 有权
记忆装置校正高能粒子碰撞的影响

Memory device correcting the effect of collision of high-energy particles
Abstract:
A memory device automatically correcting the effect of collisions of high-energy particles, comprising at least one memory cell, and further comprising: retention means for retaining, for a determined period, a single copy of the stored value stored in said memory cell; detection means for detecting a change of state of said memory cell, by comparing the stored value stored in said memory cell with the value in retention in said retention means; and management means suitable for determining whether a detected change of state of said memory cell is due to a high-energy particle and, in which case, to automatically command a reloading of the stored value stored in said retention means into said memory cell.
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