Invention Grant
- Patent Title: System and method for x-ray inspection
- Patent Title (中): x射线检查的系统和方法
-
Application No.: US13235123Application Date: 2011-09-16
-
Publication No.: US08971486B2Publication Date: 2015-03-03
- Inventor: Axel Scholling
- Applicant: Axel Scholling
- Applicant Address: DE Wiesbaden
- Assignee: Smiths Heimann GmbH
- Current Assignee: Smiths Heimann GmbH
- Current Assignee Address: DE Wiesbaden
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, LLP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; G01N23/02 ; G01N23/20

Abstract:
Methods and systems for x-ray inspection are provided. The system can include a source of radiant energy configured so that the radiant energy traverses a scanning volume. The system can further include a filter between the source and the scanning volume, a conveying apparatus configured to impart relative motion between an exposure-limited subject and the scanning volume, a conveyance monitor configured to generate conveyance data reflecting a conveyance state of the exposure-limited subject, a radiant energy sensing apparatus configured to sense radiant energy from the source and to generate source radiant energy data, and a dose controller configured to acquire conveyance data, source radiant energy data, and a signal related to subject dose data, and to generate a measure that a portion of the exposure-limited subject has acquired a dose of radiant energy above a dose threshold.
Public/Granted literature
- US20120069964A1 SYSTEM AND METHOD FOR X-RAY INSPECTION Public/Granted day:2012-03-22
Information query