Invention Grant
- Patent Title: Low dose single step grating based X-ray phase contrast imaging
- Patent Title (中): 低剂量单步光栅X射线相位成像
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Application No.: US13148198Application Date: 2010-02-03
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Publication No.: US08972191B2Publication Date: 2015-03-03
- Inventor: Marco Stampanoni , Ziyu Wu , Peiping Zhu
- Applicant: Marco Stampanoni , Ziyu Wu , Peiping Zhu
- Applicant Address: CH Villigen, PSI CN Beijing
- Assignee: Paul Scherrer Institut,Institut of High Energy Physics, Chinese Academy of Sciences
- Current Assignee: Paul Scherrer Institut,Institut of High Energy Physics, Chinese Academy of Sciences
- Current Assignee Address: CH Villigen, PSI CN Beijing
- Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- Priority: EP09100099 20090205
- International Application: PCT/EP2010/051291 WO 20100203
- International Announcement: WO2010/089319 WO 20100812
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G01N21/31 ; G06F3/00 ; G06F3/01 ; G01N23/04 ; A61B6/00

Abstract:
Phase sensitive X-ray imaging methods provide substantially increased contrast over conventional absorption based imaging, and therefore new and otherwise inaccessible information. The use of gratings as optical elements in hard X-ray phase imaging overcomes some of the problems impairing the wider use of phase contrast in X-ray radiography and tomography. To separate the phase information from other contributions detected with a grating interferometer, a phase-stepping approach has been considered, which implies the acquisition of multiple radiographic projections. Here, an innovative, highly sensitive X-ray tomographic phase contrast imaging approach is presented based on grating interferometry, which extracts the phase contrast signal without the need of phase stepping. Compared to the existing phase step approach, the main advantage of this new method dubbed “reverse projection” is the significantly reduced delivered dose, without degradation of the image quality.
Public/Granted literature
- US20120041679A1 LOW DOSE SINGLE STEP GRATING BASED X-RAY PHASE CONTRAST IMAGING Public/Granted day:2012-02-16
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