Invention Grant
- Patent Title: X-ray characterization of solid small molecule organic materials
- Patent Title (中): 固体小分子有机材料的X射线表征
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Application No.: US13310683Application Date: 2011-12-02
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Publication No.: US08972205B2Publication Date: 2015-03-03
- Inventor: Simon Billinge , Kenneth Shankland , Norman Shankland , Alastair Florence
- Applicant: Simon Billinge , Kenneth Shankland , Norman Shankland , Alastair Florence
- Applicant Address: US NY New York
- Assignee: The Trustees of Columbia University in the City of New York
- Current Assignee: The Trustees of Columbia University in the City of New York
- Current Assignee Address: US NY New York
- Agency: Hughes Hubbard & Reed LLP
- Agent Lisa A. Chiarini; Walter M. Egbert, III
- Main IPC: G01N31/00
- IPC: G01N31/00 ; G01N23/207
Abstract:
The present invention provides, inter alia, methods of characterizing a small molecule organic material, e.g., a drug or a drug product. This method includes subjecting the solid small molecule organic material to x-ray total scattering analysis at a short wavelength, collecting data generated thereby, and mathematically transforming the data to provide a refined set of data.
Public/Granted literature
- US20120106707A1 X-Ray Characterization of Solid Small Molecule Organic Materials Public/Granted day:2012-05-03
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