Invention Grant
- Patent Title: Method and system for dimensionality reduction and evaluating the class of a test datum in a large-dimension data space
- Patent Title (中): 用于维度降低和评估大尺度数据空间中测试基准类的方法和系统
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Application No.: US13503633Application Date: 2010-06-02
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Publication No.: US08972319B2Publication Date: 2015-03-03
- Inventor: Sylvain Lespinats , Michaël Aupetit
- Applicant: Sylvain Lespinats , Michaël Aupetit
- Applicant Address: FR Paris
- Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
- Current Assignee: Commissariat a l'Energie Atomique et aux Energies Alternatives
- Current Assignee Address: FR Paris
- Agency: Baker Hostetler LLP
- Priority: FR0905116 20091023
- International Application: PCT/EP2010/057749 WO 20100602
- International Announcement: WO2011/047889 WO 20110428
- Main IPC: G06F17/00
- IPC: G06F17/00 ; G06N99/00 ; G06K9/62

Abstract:
A method and a system for evaluating the class of a test datum in an original metric space, each datum belonging to at least one class grouping a plurality of data, includes a step of graphical representation of the spatial organization of a set of learning data of the original space in a representation metric space, a conjoint membership level indicating if any two data from the learning set belong to the same class. The method also includes a step of relating the test datum to the projections of the data from the learning set, the most probable class of the test datum being the class of the projections of the data from the learning set related to the test datum. Application: assistance with decision-making in discrimination, shape recognition.
Public/Granted literature
- US20130132310A1 Method and System for Evaluating the Class of a Test Datum in a Large-Dimension Data Space Public/Granted day:2013-05-23
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