Invention Grant
- Patent Title: Classifying processor testcases
- Patent Title (中): 分类处理器测试箱
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Application No.: US13549040Application Date: 2012-07-13
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Publication No.: US08972785B2Publication Date: 2015-03-03
- Inventor: Brian C. Kahne
- Applicant: Brian C. Kahne
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Embodiments of a testcase checker system are disclosed herein. Embodiments of a testcase checker system may include an instruction set simulator configured to simulate execution of instructions of a testcase on a microprocessor using a reference model associated with an architecture of the microprocessor. The instruction set simulator may generate logging data associated with the each instruction based on the simulated execution of that instruction. The testcase checker system may also include checker module comprising a set of rules. Each of these rules may be associated with a boundedly undefined condition. The checker module is configured to receive the logging data associated with an instruction from the instruction set simulator and process the logging data based on the rules to determine if any of the rules are violated.
Public/Granted literature
- US20140019806A1 CLASSIFYING PROCESSOR TESTCASES Public/Granted day:2014-01-16
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