Invention Grant
- Patent Title: Dynamic collection of instrumentation data
- Patent Title (中): 动态收集仪器数据
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Application No.: US12415950Application Date: 2009-03-31
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Publication No.: US08972787B2Publication Date: 2015-03-03
- Inventor: Sivarudrappa Mahesh , Kinshumann Kinshumann , Kripashankar Mohan , Shlok Bidasaria
- Applicant: Sivarudrappa Mahesh , Kinshumann Kinshumann , Kripashankar Mohan , Shlok Bidasaria
- Applicant Address: US WA Redmond
- Assignee: Microsoft Technology Licensing, LLC
- Current Assignee: Microsoft Technology Licensing, LLC
- Current Assignee Address: US WA Redmond
- Agent John Jardine; Kate Drakos; Micky Minhas
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07

Abstract:
A flexible system for collecting and reporting instrumentation metrics relating to performance of a software product. Computing devices that execute the software product receive a manifest that specifies the manner in which instrumentation metrics are collected and reported, including what instrumentation metrics are collected. Based on the manifest, an instrumentation metrics client associated with a software product may retrieve instrumentation data from a software product or other sources. The metrics client may then generate one or more instrumentation metrics, based on the instrumentation data, in accordance with instructions in the manifest. The metrics client may then take one or more actions based on the instrumentation metrics and the manifest, such as reporting the information to an instrumentation metrics server for aggregation and analysis by the metrics server or performing escalation actions that can modify the metrics collected and reported.
Public/Granted literature
- US20100251218A1 DYNAMIC COLLECTION OF INSTRUMENTATION DATA Public/Granted day:2010-09-30
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