Invention Grant
- Patent Title: Methods of planarization and electro-chemical mechanical polishing processes
- Patent Title (中): 平面化和电化学机械抛光工艺的方法
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Application No.: US12054077Application Date: 2008-03-24
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Publication No.: US08974655B2Publication Date: 2015-03-10
- Inventor: Wayne Huang , Whonchee Lee
- Applicant: Wayne Huang , Whonchee Lee
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Wells St. John P.S.
- Main IPC: C25F3/16
- IPC: C25F3/16 ; B23H5/08 ; H01L21/321

Abstract:
A method of removing a material from a surface includes providing a substrate comprising a material having a surface, contacting the surface with a polishing medium, applying a voltage to the substrate to remove material from the surface, and changing the voltage during the removing material from the surface. An electro-chemical mechanical polishing method includes providing a substrate having a surface, applying a platen to the surface, applying a first voltage to the substrate, rotating the platen and surface relative to each other at a first rotational speed, increasing to a second voltage, and decreasing to a second rotational speed.
Public/Granted literature
- US20090239379A1 Methods of Planarization and Electro-Chemical Mechanical Polishing Processes Public/Granted day:2009-09-24
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