Invention Grant
- Patent Title: Diffusing measurement window for near and mid IR multichannel sensor
- Patent Title (中): 近红外多通道传感器扩散测量窗口
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Application No.: US13153783Application Date: 2011-06-06
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Publication No.: US08975586B2Publication Date: 2015-03-10
- Inventor: Adam Krolak , Sebastien Tixier
- Applicant: Adam Krolak , Sebastien Tixier
- Applicant Address: CA Mississauga
- Assignee: Honeywell ASCa Inc.
- Current Assignee: Honeywell ASCa Inc.
- Current Assignee Address: CA Mississauga
- Agency: Cascio Schmoyer & Zervas
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01J5/08 ; G02B5/02 ; G01B11/06 ; G01N21/3563 ; G01N21/84 ; G01N21/86 ; G01N21/3559 ; G01N21/47 ; G01N21/03 ; G01N21/89

Abstract:
A diffuse reflector of radiation in the near and mid infrared regions includes (i) an assembly that has a reflecting element and a diffusing element that is made of one or more layers of calcium fluoride, sapphire, or alumina; or (ii) a diffusively reflective surface configured as a metallic layer with a rough surface. The diffuse reflector can be incorporated into systems for measuring properties of sheet materials and particularly into optical sensors that include a measurement window configured with one or more of the diffuse reflectors that cause incident radiation from a sensor light source to be diffused and reflected a plurality of times within a layer of material before being detected by the sensor receiver.
Public/Granted literature
- US20120305775A1 Diffusing Measurement Window for Near and Mid IR Multichannel Sensor Public/Granted day:2012-12-06
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