Invention Grant
- Patent Title: Systems and methods for plasma doping microfeature workpieces
- Patent Title (中): 等离子体掺杂微型工件的系统和方法
-
Application No.: US14171430Application Date: 2014-02-03
-
Publication No.: US08975603B2Publication Date: 2015-03-10
- Inventor: Shu Qin , Allen McTeer
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: G21K5/04
- IPC: G21K5/04 ; C23C16/515 ; C23C14/48 ; C23C14/16 ; H01L21/223 ; H01J37/32 ; C23C16/517 ; C23C16/28

Abstract:
Systems and methods for plasma doping microfeature workpieces are disclosed herein. In one embodiment, a method of implanting boron ions into a region of a workpiece includes generating a plasma in a chamber, selectively applying a pulsed electrical potential to the workpiece with a duty cycle of between approximately 20 percent and approximately 50 percent, and implanting an ion specie into the region of the workpiece.
Public/Granted literature
- US20140144379A1 SYSTEMS AND METHODS FOR PLASMA DOPING MICROFEATURE WORKPIECES Public/Granted day:2014-05-29
Information query