Invention Grant
- Patent Title: Lithographic apparatus and lithographic apparatus cooling method
- Patent Title (中): 平版印刷设备和光刻设备冷却方法
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Application No.: US13115309Application Date: 2011-05-25
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Publication No.: US08976333B2Publication Date: 2015-03-10
- Inventor: Sjoerd Nicolaas Lambertus Donders
- Applicant: Sjoerd Nicolaas Lambertus Donders
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03F7/20
- IPC: G03F7/20 ; F28F27/00

Abstract:
A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and a cooling system to cool a part of the lithographic apparatus with increased cooling capabilities to reduce the heat transfer from the part to other parts of the apparatus.
Public/Granted literature
- US20110317137A1 LITHOGRAPHIC APPARATUS AND LITHOGRAPHIC APPARATUS COOLING METHOD Public/Granted day:2011-12-29
Information query
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