Invention Grant
US08976895B2 Method for calibrating a linearizer and linearized electronic component
有权
用于校准线性化电路和线性化电子部件的方法
- Patent Title: Method for calibrating a linearizer and linearized electronic component
- Patent Title (中): 用于校准线性化电路和线性化电子部件的方法
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Application No.: US13904216Application Date: 2013-05-29
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Publication No.: US08976895B2Publication Date: 2015-03-10
- Inventor: Jacques Sombrin , Xavier Giraud , Alexandre Guerin , Guy Lesthievent , Jean-Pierre Millerioux , Xavier Deplancq
- Applicant: Centre National d'Etudes Spatiales
- Applicant Address: FR
- Assignee: Centre National d'Etudes Spatiales
- Current Assignee: Centre National d'Etudes Spatiales
- Current Assignee Address: FR
- Agency: Cantor Colburn LLP
- Priority: FR1254961 20120530
- Main IPC: H04K1/02
- IPC: H04K1/02 ; H04L25/03 ; H04L25/49 ; H04B1/04 ; H03F1/32

Abstract:
Method for calibrating a linearizer and linearized electronic component the method comprises predistortion, in a predistortion linearizer, of a signal upstream of an electronic component to compensate nonlinear distortion. Determining predistortion setting parameters comprises applying a bifrequency test signal to the component and measuring the relative amplitudes of the lines at the output of the component. A variable indicative of the magnitude |Kp| of the AM/PM conversion coefficient of the component is calculated on the basis of these measurements. The predistortion setting parameters are adjusted so as to minimize |Kp|. The method may in particular be implemented in a linearized amplifier device and in an amplifier test bench.
Public/Granted literature
- US20130336422A1 Method for calibrating a linearizer and linearized electronic component Public/Granted day:2013-12-19
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