Invention Grant
- Patent Title: Spectrum analyzer using multiple intermediate frequencies and multiple clock configurations for residual, spurious and image signal reduction
- Patent Title (中): 频谱分析仪使用多个中频和多个时钟配置,用于残留,杂散和图像信号降低
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Application No.: US13026876Application Date: 2011-02-14
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Publication No.: US08977519B2Publication Date: 2015-03-10
- Inventor: Justin Crooks
- Applicant: Justin Crooks
- Applicant Address: US WA La Center
- Assignee: Test Equipment Plus, Inc
- Current Assignee: Test Equipment Plus, Inc
- Current Assignee Address: US WA La Center
- Agency: Rylander & Associates, PC
- Agent Philip R. M. Hunt
- Main IPC: G01R19/02
- IPC: G01R19/02 ; G06G7/20 ; G01R19/03 ; G01R23/16

Abstract:
A spectrum analyzer for measuring an RF signal over a selected frequency span configured to use multiple Intermediate Frequencies (IFs) for residual, spurious and image signal reduction. The spectrum analyzer has both a primary IF path and a secondary IF path configured to provide band pass filtering of the IF signals. A master clock synthesizer is configured to reduce residual noise by providing from a single Voltage Controlled Oscillator, a master clock signal and a Local Oscillator (LO) signal. The spectrum analyzer has a microcontroller configured to change the frequency of the master clock signal and the LO signal if the center frequency of the selected span is sufficiently close to a known spurious signal.
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