Invention Grant
- Patent Title: Apparatus and method of measuring terahertz wave
- Patent Title (中): 测量太赫兹波的装置和方法
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Application No.: US13096803Application Date: 2011-04-28
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Publication No.: US08981301B2Publication Date: 2015-03-17
- Inventor: Takeaki Itsuji
- Applicant: Takeaki Itsuji
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Canon USA Inc. IP Division
- Priority: JP2010-113828 20100518; JP2010-175824 20100805
- Main IPC: G01J5/12
- IPC: G01J5/12 ; G01J3/42 ; G01N21/3586

Abstract:
A time-domain waveform of a terahertz wave is measured by a method based on time-domain spectroscopy by using an optical delay unit to adjust an optical path length along which excitation light propagates thereby adjusting a difference between a time at which the excitation light arrives at a generating unit configured to generate the terahertz wave and a time at which the excitation light arrives at a detection unit configured to detect the terahertz wave. The optical delay unit is driven according to a first speed pattern to acquire a first time-domain waveform. The optical delay unit is then driven according to a second speed pattern different from the first speed pattern to acquire a second time-domain waveform. The first time-domain waveform and the second time-domain waveform are averaged.
Public/Granted literature
- US20110284748A1 APPARATUS AND METHOD OF MEASURING TERAHERTZ WAVE Public/Granted day:2011-11-24
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