Invention Grant
- Patent Title: Electronic device and noise current measuring method
- Patent Title (中): 电子设备和噪声电流测量方法
-
Application No.: US13375742Application Date: 2010-05-26
-
Publication No.: US08981790B2Publication Date: 2015-03-17
- Inventor: Satoshi Nakamura , Takashi Suga , Yutaka Uematsu
- Applicant: Satoshi Nakamura , Takashi Suga , Yutaka Uematsu
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2009-134139 20090603
- International Application: PCT/JP2010/003518 WO 20100526
- International Announcement: WO2010/140318 WO 20101209
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R31/08 ; G01R31/00 ; G01R31/28 ; H05K9/00 ; H05K1/02 ; H05K1/14 ; H05K3/32

Abstract:
A noise current passing through a substrate on which an electronic component is mounted is suppressed in a housing, to provide a malfunction of an electronic device. A substrate (103) on which an electronic component is mounted is secured to a housing (102) by a metal spacer (108) and a screw (104). A noise control member (100) mainly composed of an insulation substance is disposed between the metal spacer (108) and the substrate (103). A first conductive film is formed on the metal spacer-side of the noise control member (100), and a second conductive film is formed on the substrate-side of the noise control member (100). A resistance member (101) is disposed between the first conductive film and the second conductive film. A noise current introduced from the housing to the substrate can be suppressed by the resistance member.
Public/Granted literature
- US20120119757A1 Electronic Device and Noise Current Measuring Method Public/Granted day:2012-05-17
Information query