Invention Grant
- Patent Title: Pump probe measuring device
- Patent Title (中): 泵探头测量装置
-
Application No.: US14236771Application Date: 2012-07-31
-
Publication No.: US08982451B2Publication Date: 2015-03-17
- Inventor: Hidemi Shigekawa , Osamu Takeuchi
- Applicant: Hidemi Shigekawa , Osamu Takeuchi
- Applicant Address: JP Saitama
- Assignee: Japan Science and Technology Agency
- Current Assignee: Japan Science and Technology Agency
- Current Assignee Address: JP Saitama
- Agency: Rader, Fishman & Grauer PLLC
- Priority: JP2011-169682 20110802
- International Application: PCT/JP2012/069517 WO 20120731
- International Announcement: WO2013/018813 WO 20130207
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/17 ; B82Y35/00 ; G01Q60/12

Abstract:
A pump probe measuring device (1) comprises: an ultrashort optical pulse laser generator (2) for generating a first ultrashort optical pulse train which is a pump light (3a), second and third ultrashort optical pulse trains (3b), (3c) which are probe lights; an optical shutter unit (6) to which the second and the third ultrashort pulse trains (3b), (3c) are introduced; and a detecting unit (20) including an irradiation optical system (8) for directing the pump light (3a), the first probe light (3b) and the second probe light (3c) to a sample (7), a sensor (11) for detecting a probe signal from the sample (7), and a phase-sensitive detecting means (12) connected to the sensor (11). An optical shutter control unit (10) periodically modulates the delay time of the first probe light (3b) and that of the second probe light (3c) with respect to the pump light (3a), and the modulated first and second probe lights (3a), (3b) illuminate the sample (7) alternately to detect the probe signals from the sample (7) by the phase-sensitive detecting means (12) in synchronization with the periodic modulation signal of the delay time.
Public/Granted literature
- US20140240710A1 PUMP PROBE MEASURING DEVICE Public/Granted day:2014-08-28
Information query