Invention Grant
- Patent Title: Reliable interconnect for semiconductor device
- Patent Title (中): 半导体器件的可靠互连
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Application No.: US13911095Application Date: 2013-06-06
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Publication No.: US08987134B2Publication Date: 2015-03-24
- Inventor: Zhehui Wang , Kwee Liang Yeo , Hai Cong , Huang Liu , Wen Zhan Zhou
- Applicant: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Horizon IP Pte. Ltd.
- Main IPC: H01L21/768
- IPC: H01L21/768 ; H01L23/522 ; H01L23/532 ; H01L23/48 ; H01L21/311

Abstract:
Semiconductor devices and methods of making thereof are disclosed. The semiconductor device includes a substrate prepared with a first dielectric layer formed thereon. The dielectric layer includes at least first, second and third contact regions. A second dielectric layer is disposed over the first dielectric layer. The device also includes at least first, second and third via contacts disposed in the second dielectric layer. The via contacts are coupled to the respective underlying contact regions and the via contacts do not extend beyond the underlying contact regions.
Public/Granted literature
- US20130328201A1 RELIABLE INTERCONNECT FOR SEMICONDUCTOR DEVICE Public/Granted day:2013-12-12
Information query
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