Invention Grant
- Patent Title: Fine particle measurement apparatus and optical axis calibration method
- Patent Title (中): 精细粒子测量装置和光轴校准方法
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Application No.: US13204206Application Date: 2011-08-05
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Publication No.: US08994940B2Publication Date: 2015-03-31
- Inventor: Suguru Dowaki , Shingo Imanishi , Gakuji Hashimoto , Shunpei Suzuki
- Applicant: Suguru Dowaki , Shingo Imanishi , Gakuji Hashimoto , Shunpei Suzuki
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2010-186961 20100824
- Main IPC: G01N15/02
- IPC: G01N15/02 ; G01N21/00 ; G01N21/47 ; G01N21/53

Abstract:
Disclosed is a fine particle measurement apparatus including a light condensing unit that condenses irradiated light irradiated to a sample flow where fine particles pass through and directly propagates the light without scattering, and scattered light scattered by the fine particles to an optical receiver divided into a plurality of regions; a position controller that controls the relative positions of members of an optical path; and a control unit that detects positions of condensing spots of the irradiated light and the scattered light based on signal intensities of each region of the optical receiver, and controls the position controller such that the positions of the condensing spots of the irradiated light and the scattered light match with each other.
Public/Granted literature
- US20120050737A1 FINE PARTICLE MEASUREMENT APPARATUS AND OPTICAL AXIS CALIBRATION METHOD Public/Granted day:2012-03-01
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