Invention Grant
- Patent Title: Optical position measuring instrument
- Patent Title (中): 光学位置测量仪
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Application No.: US13326754Application Date: 2011-12-15
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Publication No.: US08994958B2Publication Date: 2015-03-31
- Inventor: Wolfgang Holzapfel
- Applicant: Wolfgang Holzapfel
- Applicant Address: DE Traunreut
- Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee: Dr. Johannes Heidenhain GmbH
- Current Assignee Address: DE Traunreut
- Agency: Brinks Gilson & Lione
- Priority: DE102010063253 20101216
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01D5/38 ; G01D5/347

Abstract:
An optical position measuring instrument including a scanning plate and a scale, wherein the scale and the scanning plate are movable relative to one another. The optical position measuring instrument including a grating and a light source that emits a beam toward the grating, wherein the grating receives the beam and splits the beam into two partial beams with orthogonal polarization states. The optical position measuring instrument including a polarizer being arranged in beam paths of the two partial beams, wherein the polarizer has a structure to generate polarization effects on the two partial beam striking the polarizer that are periodically variable, wherein a polarization period of the periodically variable polarization effects is greater than a graduation period of the grating. The two partial beams being reunified into a resultant beam. A detection unit that receives the resultant beam and generates a plurality of displacement-dependent scanning signals.
Public/Granted literature
- US20120154805A1 OPTICAL POSITION MEASURING INSTRUMENT Public/Granted day:2012-06-21
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