Device and method for outputting a leaked radio frequency (RF) signal useable for triggering devices under test (DUTs). The device may include a vector signal analyzer (VSA) which may also perform the method for triggering DUTs. The VSA may include a first component, configured to generate an RF signal, an input configured to receive RF signals transmitted from DUTs, and a received RF signal conditioning portion, each coupled to an internal switching portion. The VSA may be configured to generate the RF signal via the first component, leak the RF signal from the first component to the internal switching portion, generating a leaked RF signal, route the leaked RF signal to the input, bypassing the received RF signal conditioning portion and output the leaked RF signal which is useable to trigger DUTs via the input.