Invention Grant
- Patent Title: Test system
- Patent Title (中): 测试系统
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Application No.: US13901734Application Date: 2013-05-24
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Publication No.: US08996231B2Publication Date: 2015-03-31
- Inventor: Katsumi Uratani , Koji Watanabe , Hiroshi Nakamura , Tsutomu Misogi
- Applicant: Horiba, Ltd.
- Applicant Address: JP Kyoto
- Assignee: Horiba, Ltd.
- Current Assignee: Horiba, Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Brooks Kushman P.C.
- Priority: JP2012-118185 20120524; JP2012-118186 20120524
- Main IPC: G01M15/05
- IPC: G01M15/05 ; G01M15/10 ; G01M17/00

Abstract:
An administrating device that administrates a plurality of units for test used for a test of a mobile object such as a vehicle or a constituting component of the mobile object comprises a recognizing part that recognizes an assembly of one or more units for test as a group for test and an assembly of one or more group for test as a device for test, and an administrating body part that conducts a predetermined batch operation command or a predetermined batch setting for a unit for test that belongs to the designated one or more groups for test and/or that conducts a predetermined batch operation command or a predetermined batch setting on a unit for test that belongs to the designated one or more device for test.
Public/Granted literature
- US20130317689A1 TEST SYSTEM Public/Granted day:2013-11-28
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