Invention Grant
- Patent Title: Method of fabricating an analyzer
- Patent Title (中): 制造分析仪的方法
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Application No.: US13353387Application Date: 2012-01-19
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Publication No.: US08997331B2Publication Date: 2015-04-07
- Inventor: David Thomas Shadwick
- Applicant: David Thomas Shadwick
- Applicant Address: US KY Lexington
- Assignee: Lexmark International, Inc.
- Current Assignee: Lexmark International, Inc.
- Current Assignee Address: US KY Lexington
- Main IPC: G01R31/28
- IPC: G01R31/28 ; G01B7/00 ; B41J3/46

Abstract:
A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.
Public/Granted literature
- US20120110806A1 DEVICE FOR ANALYZING SIZE AND LOCATION OF CONDUCTIVE ITEM Public/Granted day:2012-05-10
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