Invention Grant
US08997331B2 Method of fabricating an analyzer 有权
制造分析仪的方法

Method of fabricating an analyzer
Abstract:
A matrix analyzer for determining the size and location of a conductive item placed thereon. The matrix analyzer includes plural row conductors and column conductors with a corresponding grid of conductive areas exposed on the surface of the matrix analyzer. When a conductive item, such as an ink droplet, is jetted onto the matrix analyzer, the intersection of various row conductors and column conductors exhibit a low resistance. The rows and columns of the matrix analyzer can be sequentially accessed to find those intersections where the low resistance exists. From such data, the size and location of the ink droplets can be determined.
Public/Granted literature
Information query
Patent Agency Ranking
0/0